Gaya APA

Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry. (2006). Semarang: Pusat Kaj. Teknologi Industri Sultan Agung.

Gaya MLA

Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry. . Semarang: Pusat Kaj. Teknologi Industri Sultan Agung, 2006. Artikel.