Gaya APA

ROFI'I, I. (2006). Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry . Semarang: Pusat Kaj. Teknologi Industri Sultan Agung.

Gaya MLA

ROFI'I, Imam. "Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry". Semarang: Pusat Kaj. Teknologi Industri Sultan Agung, 2006. Artikel.