Penggayaan APA
ROFI'I, Imam. (2006).
Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry .
Semarang:
Pusat Kaj. Teknologi Industri Sultan Agung.
Chicago Style
ROFI'I, Imam.
Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry.
Semarang:
Pusat Kaj. Teknologi Industri Sultan Agung,
2006.
Artikel.
MLA Style
ROFI'I, Imam.
Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry.
Semarang:
Pusat Kaj. Teknologi Industri Sultan Agung,
2006.
Artikel.
Turabian Style
ROFI'I, Imam.
Determination of Germanium Profile on Ion Implanted GaAs Using Secondary Ion Mass Spectrometry.
Semarang:
Pusat Kaj. Teknologi Industri Sultan Agung,
2006.
Artikel.