E Book

Modern Techniques for Characterizing Magnetic Materials

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Neutron Scattering -- Magnetic neutron scattering -- Small-angle neutron scattering -- Application of polarized neutron reflectometry to studies of artificially structured magnetic materials -- X-ray Scattering -- Resonant soft x-ray techniques to resolve nanoscale magnetism -- Hard x-ray resonant techniques for studies of nanomagnetism -- Spin-resolved photoemission studies of magnetic films -- Electron Scattering -- Magnetic phase imaging with transmission electron microscopy -- Spin-polarized scanning electron microscopy -- Spin-polarized low energy electron microscopy (SPLEEM) -- Proximal Probe -- Spin-polarized scanning tunneling microscopy -- Magnetic force microscopy -- Light Scattering -- Scanning near-field magneto-optic microscopy -- Magnetization dynamics using time-resolved magneto-optic microscopy -- Brillouin light scattering spectroscopy.MODERN TECHNIQUES FOR CHARACTERIZING MAGNETIC MATERIALS provides an extensive overview of novel characterization tools for magnetic materials including neutron, photon and electron scatterings and other microscopy techniques by world renowned scientists. This is an interdisciplinary book. Currently there is no existing book that describes all available techniques to characterize and to understand magnetic materials. These techniques cover a wide range of length scales and belong to different scientific communities that have little cross-discipline communication. The book will build bridges for them. It is important to note that each technique has its own advantages and drawbacks. Very often combined use of different techniques is essential to the understanding of the ever increasing complexity of modern magnetic materials at nanometer scales. The book includes, but is not limited to the following areas: Magnetic neutron scattering with 3-axis spectrometer * Small-angle neutrons scattering * Polarized neutron magnetic reflectometry * Resonant soft x-ray magneto-optic scattering * Magnetic hard x-ray scattering * Spin resolved photoemission spectroscopy * Lorentz microscopy and electron holography * Scanning electron microscopy with polarization analysis * Spin polarized low energy electron microscopy * Spin-polarized scanning tunneling microscopy * Magnetic force microscopy * Near-field scanning optical microscopy * Time-resolved scanning Kerr microscopy * Brillouin light scattering spectroscopy This reference will be a valuable resource for all graduate students, researchers, engineers and scientists who are interested in magnetic materials including their crystal structure, electronic structure, magnetization dynamics and their associated magnetic properties and underlying magnetism.

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Ketersediaan

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Informasi Detail

Judul Seri

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No. Panggil

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Penerbit

Boston, MA : Springer., 2005

Deskripsi Fisik

XX, 600 p. 460 illus., 53 illus. in color.online resource.

Bahasa

English

ISBN/ISSN

9780387233956

Klasifikasi

620.11

Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

1st ed.

Subjek

Electronics.
Microelectronics.
Electronics and Microelectronics, Instrumentation.
Magnetism.
Magnetic materials.
Magnetism, Magnetic Materials.
Materials science.
Characterization and Evaluation of Materials.
Materials—Surfaces.
Thin films.
Condensed matter.
Surfaces and Interfaces, Thin Films.
Condensed Matter Physics.

Info Detail Spesifik

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Pernyataan Tanggungjawab

Yimei Zhu.

Versi lain/terkait

Lampiran Berkas

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