Ditapis dengan
Introduction to Advanced System-on-Chip Test Design and Optimization
Testing Concepts -- Design Flow -- Design for Test -- Boundary Scan -- SOC Design for Testability -- System Modeling -- Test Conflicts -- Test Power Dissipation -- Test Access Mechanism -- Test Scheduling -- SOC Test Applications -- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling -- An Integrated Framework for the Design and Optimization of SO…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9780387256245
- Deskripsi Fisik
- XX, 388 p.online resource.
- Judul Seri
- -
- No. Panggil
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H-infinity Control and Estimation of State-multiplicative Linear Systems
Part I: Introduction and Literature Survey: Introduction -- Part II: Continuous-time Systems: Control and Luenberger-type Filtering; General Filtering; Tracking Control; Static Output-feedback; Stochastic Passivity -- Part III: Discrete-time Systems: Control and Luenberger-type Filtering; General Filtering; Tracking Control; Static Output-feedback -- Part IV: Applications: Systems with State-mu…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9781846283376
- Deskripsi Fisik
- XV, 249 p. 24 illus.online resource.
- Judul Seri
- -
- No. Panggil
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Multilayered Low Temperature Cofired Ceramics (LTCC) Technology
The Possibility of High Frequency Functional Ceramics Substrate -- Material technology -- Ceramic material -- Conducting material -- Resistor materials and high K dielectric materials -- Process technology -- Powder preparation and mixing -- Casting -- Printing and laminating -- Cofiring -- Reliability -- Future of LTCCs.In recent years, Low Temperature Cofired Ceramics (LTCC) have become an at…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9780387233147
- Deskripsi Fisik
- XXXI, 229 p.online resource.
- Judul Seri
- -
- No. Panggil
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Microscopy of Semiconducting Materials
Epitaxy: Wide Band-Gap Nitrides -- Epitaxy: Silicon-Germanium Alloys -- Epitaxy: Growth and Defect Phenomena -- High Resolution Microscopy and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials -- Device Studies -- Scanning Electron and Scanning Probe Advances.This is a long-established international biennial conference series, organised…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9783540319153
- Deskripsi Fisik
- XVI, 540 p.online resource.
- Judul Seri
- -
- No. Panggil
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Modern Techniques for Characterizing Magnetic Materials
Neutron Scattering -- Magnetic neutron scattering -- Small-angle neutron scattering -- Application of polarized neutron reflectometry to studies of artificially structured magnetic materials -- X-ray Scattering -- Resonant soft x-ray techniques to resolve nanoscale magnetism -- Hard x-ray resonant techniques for studies of nanomagnetism -- Spin-resolved photoemission studies of magnetic films -…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9780387233956
- Deskripsi Fisik
- XX, 600 p. 460 illus., 53 illus. in color.online resource.
- Judul Seri
- -
- No. Panggil
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Fractals in Engineering
Mathematical Aspects -- Theory and Applications of Fractal Tops -- Splines, Fractal Functions, and Besov and Triebel-Lizorkin Spaces -- Hölderian random functions -- Fractal Stationary Density in Coupled Maps -- Physics -- A Network of Fractal Force Chains and Their Effect in Granular Materials under Compression -- Percolation and permeability of three dimensional fracture networks with a powe…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9781846280481
- Deskripsi Fisik
- XVI, 290 p.online resource.
- Judul Seri
- -
- No. Panggil
- -
Fault Diagnosis of Analog Integrated Circuits
Introduction. Basic test issues. Introduction. A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme. Introduction. The diagnosis procedure. The test stimulus generation. The fault modelling. Approximation modelling of the analogue integrated circuits. Artificial neural networks: an overview. Summary and conclusions -- Fault Diagnosis in …
- Edisi
- 1st ed.
- ISBN/ISSN
- 9780387257433
- Deskripsi Fisik
- X, 182 p.online resource.
- Judul Seri
- -
- No. Panggil
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Electronic Noise and Interfering Signals
Intrinsic Noise -- Fundamental Concepts -- Physical Noise Sources -- Noise Parameters -- Noise Analysis of Linear Circuits -- Frequency Domain Noise Analysis of Linear Multiports -- Noise Models of Electronic Devices -- Interfering Signals -- External Noise -- Interference Reduction Methods -- Methods of Reducing Emission of Interfering Signals -- Interconnection Modeling and Crosstalk -- Metho…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9783540265108
- Deskripsi Fisik
- XVIII, 709 p.online resource.
- Judul Seri
- -
- No. Panggil
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Dynamic Characterisation of Analogue-to-Digital Converters
ADC Characterisation Based on Sinewave Analysis -- ADC Applications, Architectures and Terminology -- Sinewave Test Setup -- Time-Domain Data Analysis -- Frequency-Domain Data Analysis -- Code Histogram Test -- Comparative Study of ADC Sinewave Test Methods -- Measurement of Additional Parameters -- Jitter Measurement -- Differential Gain and Phase Testing -- Step and Transient Response Measure…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9780387259031
- Deskripsi Fisik
- XX, 280 p.online resource.
- Judul Seri
- -
- No. Panggil
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Digital Synthesizers and Transmitters for Software Radio
1. Transmitters -- 2. Power Amplifier Linearization -- 3. Digital Compensation Methods for Analog I/Q Modulator Errors -- 4. Direct Digital Synthesizers -- 5. Recursive Oscillators -- 6. Cordic Algorithm -- 7. Sources of Noise and Spurs in DDS -- 8. Spur Reduction Techniques in Sine Output Direct Digital Synthesizer -- 9. Blocks of Direct Digital Synthesizers -- 10. Current Steering D/A Convert…
- Edisi
- 1st ed.
- ISBN/ISSN
- 9781402031953
- Deskripsi Fisik
- XXVII, 359 p.online resource.
- Judul Seri
- -
- No. Panggil
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