Epitaxy: Wide Band-Gap Nitrides -- Epitaxy: Silicon-Germanium Alloys -- Epitaxy: Growth and Defect Phenomena -- High Resolution Microscopy and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials -- Device Studies -- Scanning Electron and Scanning Probe Advances.This is a long-established international biennial conference series, organised…
Neutron Scattering -- Magnetic neutron scattering -- Small-angle neutron scattering -- Application of polarized neutron reflectometry to studies of artificially structured magnetic materials -- X-ray Scattering -- Resonant soft x-ray techniques to resolve nanoscale magnetism -- Hard x-ray resonant techniques for studies of nanomagnetism -- Spin-resolved photoemission studies of magnetic films -…
Mathematical Aspects -- Theory and Applications of Fractal Tops -- Splines, Fractal Functions, and Besov and Triebel-Lizorkin Spaces -- Hölderian random functions -- Fractal Stationary Density in Coupled Maps -- Physics -- A Network of Fractal Force Chains and Their Effect in Granular Materials under Compression -- Percolation and permeability of three dimensional fracture networks with a powe…
Introduction. Basic test issues. Introduction. A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme. Introduction. The diagnosis procedure. The test stimulus generation. The fault modelling. Approximation modelling of the analogue integrated circuits. Artificial neural networks: an overview. Summary and conclusions -- Fault Diagnosis in …
Intrinsic Noise -- Fundamental Concepts -- Physical Noise Sources -- Noise Parameters -- Noise Analysis of Linear Circuits -- Frequency Domain Noise Analysis of Linear Multiports -- Noise Models of Electronic Devices -- Interfering Signals -- External Noise -- Interference Reduction Methods -- Methods of Reducing Emission of Interfering Signals -- Interconnection Modeling and Crosstalk -- Metho…
ADC Characterisation Based on Sinewave Analysis -- ADC Applications, Architectures and Terminology -- Sinewave Test Setup -- Time-Domain Data Analysis -- Frequency-Domain Data Analysis -- Code Histogram Test -- Comparative Study of ADC Sinewave Test Methods -- Measurement of Additional Parameters -- Jitter Measurement -- Differential Gain and Phase Testing -- Step and Transient Response Measure…
1. Transmitters -- 2. Power Amplifier Linearization -- 3. Digital Compensation Methods for Analog I/Q Modulator Errors -- 4. Direct Digital Synthesizers -- 5. Recursive Oscillators -- 6. Cordic Algorithm -- 7. Sources of Noise and Spurs in DDS -- 8. Spur Reduction Techniques in Sine Output Direct Digital Synthesizer -- 9. Blocks of Direct Digital Synthesizers -- 10. Current Steering D/A Convert…
Design of Wireless Autonomous Dataloggers IC's reveals the state of the art in the design of complex dataloggers, with a special focus on low power consumption. The emphasis is on autonomous dataloggers for stand-alone applications with remote reprogrammability. The book starts with a comprehensive introduction on the most important design aspects and trade-offs for miniaturized low-power telem…
Introduction -- Statistics -- Yield Statistics -- Area Dependence of the Yield -- Statistics of Embedded Object Fails -- Fail Commonalities -- Spatial Patterns -- Test Coverage and Test Fallout -- Logic Diagnosis -- Slat Based Diagnosis -- Data Collection Requirements -- Appendix A. Distribution of IC Fails -- Appendix B. General Yield Model -- Appendix C. Simplified Center-Satellite Model -- A…
Architecture -- Logic -- Circuits and Layout -- Verification and Testing -- Tools -- Verilog.I am honored to write the foreword for Chandra Thimmannagari’s book on CPU design. Chandra’s book provides a practical overview of Microprocessor and high end ASIC design as practiced today. It is a valuable addition to the literature on CPU design, and is made possible by Chandra’s unique combina…